Tag: microscopy

How AFM Products Are Shaping Our Future

Scanning tunnelling microscopy (STP) is often considered ‘the ancestor’ of atomic force microscopy. It was invented by scientists at IBM Zurich, who were then awarded a Nobel Prize in physics some years later. Advancements in this original technology…

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Measuring on the Nanoscale – A Whole New World in Materials Science

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Measuring materials properly involves comparing the characteristics of test structures to the real internal properties of the materials at hand. If there are plenty of differences in the materials when examined on a nano scale using atomic force…

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